1 |
08.29 - 09.04 |
1 |
Introduction,
Reviews of Semidonductor Phydics |
Ch 1-4 |
|
2 |
09.05 - 09.11 |
1 |
Reviews od PN Junction |
Ch.5-6 |
|
3 |
09.12 - 09.18 |
1 |
MOSFETs (Qualitative Analysis) |
7.1-7.2 |
|
4 |
09.19 - 09.25 |
1 |
MOSFETs (Qualitative Analysis) |
7.3=7.4 |
|
5 |
09.26 - 10.02 |
1 |
Threshold Voltage and Low-Field Mobility, Subthreshold Leakage Current |
8.1-8.3 |
|
6 |
10.03 - 10.09 |
1 |
CMOS, Switching in CMOS nverter Circuits |
8.4-8.5 |
|
7 |
10.10 - 10.16 |
1 |
MOSFET Equivalent Circuit, fT
Midterm Exam |
8.6-8.7 |
|
8 |
10.17 - 10.23 |
1 |
Chort Channel Effects, MOSFET Scaling, ,SOI, Other FETs |
8.8-8.10 |
Mid-term Exam |
9 |
10.24 - 10.30 |
1 |
BJT Output Characteristics (Quantitative), Current Gain |
9.1-9.3 |
|
10 |
10.31 - 11.06 |
1 |
Model of a Prototype BJT,
Doping Gradient in BJTs |
9.4-9.5 |
|
11 |
11.07 - 11.13 |
1 |
Basic Ebers-Moll DC Model, Current Crowding and Base Resistance |
9.6-9,8 |
|
12 |
11.14 - 11.20 |
1 |
Early Effect, Avalanche Breakdown, HIgh Injection, Base Push-out, Recombination in E-B Junction |
9.8-9.12 |
|
13 |
11.21 - 11.27 |
1 |
Ebers-Mall AC Model, Small-Signal Equivalent Circuits |
10.1-10.3 |
|
14 |
11.28 - 12.04 |
1 |
Optoeelcric Devices |
11.1-11.4 |
|
15 |
12.05 - 12.11 |
1 |
Review and Final Exam |
|
|
16 |
12.12 - 12.18 |
1 |
Power Devices(Power Diodes, Power MOSFET, IGBT, Thyristor) |
14.1-14.4 |
Final Exam
|